Avoiding Bad Bit Patterns for Unreliable DRAM Memory Cells

Published in Highlighting Undergraduate Research at the University of Pittsburgh Swanson School of Engineering, 2016

Recommended citation: Higgins, Erin, and Alex Jones. "Avoiding Bad Bit Patterns for Unreliable DRAM Memory Cells." Highlighting Undergraduate Research at the University of Pittsburgh Swanson School of Engineering (2016): 40. https://issuu.com/pittswanson/docs/104984_pitt_engineering_abstractshr

This paper details a project I worked on regarding avoiding bad bit patterns in DRAM. View link here. Recommended citation: Higgins, Erin, and Alex Jones. "Avoiding Bad Bit Patterns for Unreliable DRAM Memory Cells." Highlighting Undergraduate Research at the University of Pittsburgh Swanson School of Engineering (2016): 40..