Avoiding Bad Bit Patterns for Unreliable DRAM Memory Cells
Published in Highlighting Undergraduate Research at the University of Pittsburgh Swanson School of Engineering, 2016
Recommended citation: Higgins, Erin, and Alex Jones. "Avoiding Bad Bit Patterns for Unreliable DRAM Memory Cells." Highlighting Undergraduate Research at the University of Pittsburgh Swanson School of Engineering (2016): 40. https://issuu.com/pittswanson/docs/104984_pitt_engineering_abstractshr